50.4. EEPROM HAL EMULLATION Functional Test

50.4.1. Overview

This sample demonstrates using the EEPROM HAL driver interface to access EEPROM storage. By default it uses the e2p_emulation component (Flash-based EEPROM emulation) so that no physical EEPROM hardware is required. The same HAL API can be used with a physical EEPROM device by registering a different driver.

50.4.2. Board Setup

• No special hardware setup is required when using the emulation backend (NOR Flash is used).

50.4.3. Configuration

Emulation parameters are defined in main.c:

Macro	Description
BOARD_APP_EEPROM_EMU_ERASE_SIZE	Flash erase unit size (default 4096 bytes)
BOARD_APP_EEPROM_EMU_SECTOR_COUNT	Sector count, must be even (default 32)
BOARD_APP_EEPROM_EMU_START_ADDR	Start address of emulation region (derived from flash size and above)

The emulation region is placed at the end of the board’s NOR Flash (two half-areas for power-loss protection).

50.4.4. Test Content

The sample runs two test suites:

1. Basic I/O (Small Writes)

   • Single-byte write and read at a fixed address (e.g. 0x42)

   • Small non-aligned write (7 bytes at address 5) and read-back verification

2. Large Block, Multi-Page, Non-Aligned I/O

   • Write 150 bytes from a non-aligned address (0xA)

   • Verifies cross-page and anti-wraparound behavior

   • Read-back and compare

All tests use the HAL API: hpm_eeprom_write_block() and hpm_eeprom_read_block().

50.4.5. Usage Steps

1. Register emulation parameters with the device structure:

   e2p_emu_xpi_host_config_t emu_host = { .base = BOARD_APP_XPI_NOR_XPI_BASE };
   e2p_emu_xpi_attribute_config_t emu_config = {
       .flash_base_addr = BOARD_FLASH_BASE_ADDRESS,
       .version = 0x4553,
       .opt_header = BOARD_APP_XPI_NOR_CFG_OPT_HDR,
       .opt0 = BOARD_APP_XPI_NOR_CFG_OPT_OPT0,
       .opt1 = BOARD_APP_XPI_NOR_CFG_OPT_OPT1,
       .start_addr = BOARD_APP_EEPROM_EMU_START_ADDR,
       .erase_size = BOARD_APP_EEPROM_EMU_ERASE_SIZE,
       .sector_cnt = BOARD_APP_EEPROM_EMU_SECTOR_COUNT,
   };
   hpm_eeprom_device_t dev = {
       .host = &emu_host,
       .flag = EEPROM_FLAG_EMULATION_XPI,
       .config = &emu_config,
   };
   e2p_emulation_xpi_register_param(&dev);
   

2. Register the device with the HAL and open it:

   hpm_eeprom_register(&dev, "e2p_test");
   hpm_eeprom_device_t *device = hpm_eeprom_find("e2p_test");
   hpm_eeprom_init(device);
   

3. Use HAL read/write API:

   hpm_eeprom_write_block(device, addr, len, data);
   hpm_eeprom_read_block(device, addr, len, buf);
   

50.4.6. Running the Example

After the project runs, the serial console shows init and test results. When using the e2p_emulation component, init output looks like:

EEPROM HAL sample test start.

------------ flash->eeprom init ok -----------
start address: 0x80fc0000
sector count: 16
flash erase granularity: 4096
version: 0x4553
end address: 0x80fd0000
data write addr = 0x80fc013c, info write addr = 0x80fcff84, remain flash size = 0xfe48
valid count percent info count( 3 / 6 )
----------------------------------------------

Then the test output:

--- Running Test: Basic I/O (Small Writes) ---
Testing single byte write at a known-good address (e.g., 0x42)...
[PASS] Single Byte I/O: Data verified successfully.
Testing a small, non-aligned write...
[PASS] Small Non-aligned Write: Data verified successfully.
--- [PASS] Basic I/O (Small Writes) ---

--- Running Test: Large Block, Multi-Page, Non-Aligned I/O ---
Writing a large block (150 bytes) from a non-aligned address (0xA)...
[PASS] Large Block Verification: Data verified successfully.
--- [PASS] Large Block, Multi-Page, Non-Aligned I/O ---

Result: ALL TESTS PASSED!
EEPROM HAL sample test done.