8.2. Eeprom emulation performance test

8.2.1. Overview

The EEPROM PERF example runs performance testing on simulated EEPROM with 100 data records and 500 records.It’s contain the follow:

config time

  • format area

  • write prepared data

  • test config time

flush time

  • write prepared data

  • test flush time

read time

  • write prepared data

  • test read time

8.2.2. Board setting

  • No special settings

8.2.3. Notice

  • Do not write more than one erase size data once

  • Eeprom emulation needs to be set EEPROM_MAX_VAR_CNT which default count 100 in user_config.h to limit the maximum number of blocks

8.2.4. Running the example

The serial port output is shown below:

 eeprom emulation perf test
----------------------------------------
 1 - Test config perf
 2 - Test flush perf
 3 - Test read perf
 4 - show area base info
 Others - Show index menu

◆1

check version failed, begin earse all sector, it will take some time

------------ flash->eeprom init ok -----------

start address: 0x80080000
sector count: 128
flash earse granularity: 4096
version: 0x4553
end address: 0x80100000
data write addr = 0x80080000, info write addr = 0x800fffe0, remain flash size = 0x7ffe0

valid count percent info count( 0 / 0 )

----------------------------------------------

◆2
------------ flash->eeprom init ok -----------

start address: 0x80080000
sector count: 128
flash earse granularity: 4096
version: 0x4553
end address: 0x80100000
data write addr = 0x80080fa0, info write addr = 0x800fe0a0, remain flash size = 0x7d100

valid count percent info count( 100 / 500 )

----------------------------------------------

eeprom flush run time=(6103720)us

◆3

eeprom read run time=(54)us