.. _eeprom_hal_emulation:

Eeprom hal emulation 功能测试
==========================================

概述
------

EEPROM HAL EMULATION 示例演示如何使用 EEPROM HAL 驱动程序接口来访问 EEPROM 设备, 该示例默认使用模拟 EEPROM 组件来实现 EEPROM 设备的行为。

板级设置
------------

- 硬件无需特殊设置

测试内容
------------

- 基本功能：单字节读写测试
- 小块数据读写测试：页内非对齐地址读写测试
- 大块数据读写测试：跨页非对齐地址读写测试(防回卷测试)

运行示例
------------

当工程运行后，串口会打印以下信息：

.. code-block:: console

    EEPROM HAL sample test start.

    （该部分打印信息只有使用模拟 eeprom 组件时才会出现：）

    ------------ flash->eeprom init ok -----------
    start address: 0x80fc0000
    sector count: 16
    flash earse granularity: 4096
    version: 0x4553
    end address: 0x80fd0000
    data write addr = 0x80fc013c, info write addr = 0x80fcff84, remain flash size = 0xfe48
    valid count percent info count( 3 / 6 )
    ----------------------------------------------

    测试打印信息：

    --- Running Test: Basic I/O (Small Writes) ---
    Testing single byte write at a known-good address (e.g., 0x42)...
    [PASS] Single Byte I/O: Data verified successfully.
    Testing a small, non-aligned write...
    [PASS] Small Non-aligned Write: Data verified successfully.
    --- [PASS] Basic I/O (Small Writes) ---

    --- Running Test: Large Block, Multi-Page, Non-Aligned I/O ---
    Writing a large block (150 bytes) from a non-aligned address (0xA)...
    [PASS] Large Block Verification: Data verified successfully.
    --- [PASS] Large Block, Multi-Page, Non-Aligned I/O ---
    Result: ALL TESTS PASSED!
    EEPROM HAL sample test done.