8.2. Eeprom emulation 性能测试

8.2.1. 概述

EEPROM PERF示例以100笔数据，500条记录对模拟eeprom进行性能测试，主要包括以下测试内容：

初始化时间

format area
write prepared data
test config time

数据整理时间

write prepared data
test flush time

读取时间

write prepared data
test read time

8.2.2. 板级设置

无需特殊设置

8.2.3. 说明

一次写入的数据不要超过一个erase_size
需在user_config.h文件中设定EEPROM_MAX_VAR_CNT限制写入数据笔数的最大数量，默认为100笔

8.2.4. 运行示例

当工程运行后，串口会打印以下信息：

 eeprom emulation perf test
----------------------------------------
 1 - Test config perf
 2 - Test flush perf
 3 - Test read perf
 4 - show area base info
 Others - Show index menu

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check version failed, begin earse all sector, it will take some time

------------ flash->eeprom init ok -----------

start address: 0x80080000
sector count: 128
flash earse granularity: 4096
version: 0x4553
end address: 0x80100000
data write addr = 0x80080000, info write addr = 0x800fffe0, remain flash size = 0x7ffe0

valid count percent info count( 0 / 0 )

----------------------------------------------

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------------ flash->eeprom init ok -----------

start address: 0x80080000
sector count: 128
flash earse granularity: 4096
version: 0x4553
end address: 0x80100000
data write addr = 0x80080fa0, info write addr = 0x800fe0a0, remain flash size = 0x7d100

valid count percent info count( 100 / 500 )

----------------------------------------------

eeprom flush run time=(6103720)us

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eeprom read run time=(54)us