49.4. Eeprom hal emulation 功能测试

49.4.1. 概述

EEPROM HAL EMULATION 示例演示如何使用 EEPROM HAL 驱动程序接口来访问 EEPROM 设备, 该示例默认使用模拟 EEPROM 组件来实现 EEPROM 设备的行为。

49.4.2. 板级设置

• 硬件无需特殊设置

49.4.3. 测试内容

• 基本功能：单字节读写测试

• 小块数据读写测试：页内非对齐地址读写测试

• 大块数据读写测试：跨页非对齐地址读写测试(防回卷测试)

49.4.4. 运行示例

当工程运行后，串口会打印以下信息：

EEPROM HAL sample test start.

（该部分打印信息只有使用模拟 eeprom 组件时才会出现：）

------------ flash->eeprom init ok -----------
start address: 0x80fc0000
sector count: 16
flash earse granularity: 4096
version: 0x4553
end address: 0x80fd0000
data write addr = 0x80fc013c, info write addr = 0x80fcff84, remain flash size = 0xfe48
valid count percent info count( 3 / 6 )
----------------------------------------------

测试打印信息：

--- Running Test: Basic I/O (Small Writes) ---
Testing single byte write at a known-good address (e.g., 0x42)...
[PASS] Single Byte I/O: Data verified successfully.
Testing a small, non-aligned write...
[PASS] Small Non-aligned Write: Data verified successfully.
--- [PASS] Basic I/O (Small Writes) ---

--- Running Test: Large Block, Multi-Page, Non-Aligned I/O ---
Writing a large block (150 bytes) from a non-aligned address (0xA)...
[PASS] Large Block Verification: Data verified successfully.
--- [PASS] Large Block, Multi-Page, Non-Aligned I/O ---
Result: ALL TESTS PASSED!
EEPROM HAL sample test done.